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PHD
thesis
Depth profiling of organic layers by low energy ions
Duration
since 2006
Description
This project consist in a use of ToF-SIMS for the developement of a depth-profiling technic in the rising field of thin layers and multi-layers of polymers(OLED,organic electronic,...). The ToF-SIMS technic is destructive by essence but we propose to erode organic materials with reactive primary ions and a very low energy (
Research unit(s)
- (PMR)
- Laboratory for Electron Spectroscopy (LISE)
Staff
Chairperson(s) |
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| Laurent HOUSSIAU | Leader | 081/724512 | |
Research staff |
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| Nicolas MINE | Researcher | 081/725237 | |
Publications (5)
Papers
2008
MCsn+ cluster formation on organic surfaces: a novel way to depth profile organics?, in Applied Surface Science, volume 255, pp. 973-976
Nicolas MINE, Bastien DOUHARD, Laurent HOUSSIAU
Nicolas MINE, Bastien DOUHARD, Laurent HOUSSIAU
2008
Molecular depth profiling of polymers with very low energy ions, in Applied Surface Science, volume 255, pp. 970-972
Laurent HOUSSIAU, Bastien DOUHARD, Nicolas MINE
Laurent HOUSSIAU, Bastien DOUHARD, Nicolas MINE
2008
Molecular depth profiling of polymers with very low energy ions, in Physicalia Magazine, volume 30, pp. 3-23
Nicolas MINE, Laurent HOUSSIAU
Nicolas MINE, Laurent HOUSSIAU
2007
Molecular depth-profiling of polycarbonate with low energy Cs+ ions, in Rapid communication in mass spectrometry, volume 21, pp. 2680-2684
Nicolas MINE, Bastien DOUHARD, Jérémy BRISON, Laurent HOUSSIAU
Nicolas MINE, Bastien DOUHARD, Jérémy BRISON, Laurent HOUSSIAU
2007
Measurement and modeling of work function changes during low energy cesium sputtering, in Surface Science, volume 601, pp. 1467-1472
Jérémy BRISON, Nicolas MINE, Sophie POISSEROUX, Bastien DOUHARD, Roumen VITCHEV, Laurent HOUSSIAU
Jérémy BRISON, Nicolas MINE, Sophie POISSEROUX, Bastien DOUHARD, Roumen VITCHEV, Laurent HOUSSIAU
